专利内容由知识产权出版社提供
专利名称：Routing of test signals of integrated circuits发明人：Coralyn S. Gauvin申请号：US10044155申请日：20020111公开号：US07114135B1公开日：20060926
专利附图：
摘要：In an integrated circuit, test signals are routed from test points through ahierarchy of distributed multiplexers to output pads. The multiplexers are distributedlocally to various regions that are arranged in a hierarchy of regional levels. Thus, eachtest signal is routed to the locally distributed multiplexer, and only a portion of the test
signals reach the top-level multiplexer.
申请人：Coralyn S. Gauvin
地址：Colorado Springs CO US
国籍：US
代理机构：Suiter, West, Swantz PC LLO
更多信息请下载全文后查看