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专利名称：METHODS FOR QUANTITATIVE
DETERMINATION OF METHYLATIONDENSITY IN A DNA LOCUS
发明人：JEDDELOH, Jeffrey, A.,LAKEY, Nathan, D.申请号：EP04796212.1申请日：20041021公开号：EP16887B1公开日：20120321
摘要：The present invention is a novel method of determining the average DNAmethylation density of a locus of interest within a population of DNA fragments.
申请人：ORION GENOMICS LLC
地址：US
国籍：US
代理机构：Campbell, Patrick John Henry
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