专利内容由知识产权出版社提供
专利名称：Fast Pattern Discovery for Log Analytics发明人：Biplob Debnath,Jianwu Xu,Hui Zhang,Guofei
Jiang,Hossein Hamooni
申请号：US15351452申请日：20161115
公开号：US20170236023A1公开日：20170817
专利附图：
摘要：Systems and methods are disclosed for parsing logs from arbitrary or unknownsystems or applications by capturing heterogeneous logs from the arbitrary or unknownsystems or applications; generating one pattern for every unique log message; building a
pattern hierarchy tree by grouping patterns based on similarity metrics, and for everygroup it generates one pattern by combing all constituting patterns of that group; andselecting a set of patterns from the pattern hierarchy tree.
申请人：NEC Laboratories America, Inc.
地址：Princeton NJ US
国籍：US
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