专利内容由知识产权出版社提供
专利名称：METHOD AND APPARATUS FOR
ELECTRICAL TESTING
发明人：David E. Halter,Michael P. Baker,Samuel G.
Stephens
申请号：US121099申请日：20080425
公开号：US20090267624A1公开日：20091029
专利附图：
摘要：A test apparatus and device under test has a probe that can be located veryclose to contact pads and that requires very few solder connections. In addition, the
probe can be configured to meet any appropriate and desired electrical specificationwhile still using a same circuit board. There is no need to attach discrete components to acircuit board. Thus, by using a configurable probe, a single circuit board may be used withmultiple probes or a reconfigurable probe to test for compliance with a variety ofdifferent electrical specifications having different requirements.
申请人：David E. Halter,Michael P. Baker,Samuel G. Stephens
地址：Austin TX US,Round Rock TX US,Austin TX US
国籍：US,US,US
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